Access and influence all steps of a test run via a remote connection.
The bi-directionalon-chip-instrument (BOCI)method tests a radar IC and its algorithms with internal test routines. The extension of the interface allows not only to test patterns coming from the frontend on chip, but also to create artificial stimuli from a development environment and to inject them at specific points in the signal processing path to allow testing the processing chain on-chip step by step. This improvement of testing the processing chain on-chip helps increasing the accuracy by following up on intermediate test parameters. Currently BOCI is already used in the industrial (mass production) context but not yet in V&V. The implementation of BOCI in V&V will come with big advantages in terms of comparability of test results between V&V and the industrial application. WithinVALU3S,parts of BOCI will be implemented in order to enable this comparability.
Proven method in IC/SOC validation
High test speed
Independent from external test equipment
Accurate testing of internal building blocks
Exclusion of certain building blocks from the system testing