Bi-Directional On-Chip-Instrument (BOCI)

Access and influence all steps of a test run via a remote connection.

The bi-directional on-chip-instrument (BOCI) method tests a radar IC and its algorithms with internal test routines. The extension of the interface allows not only to test patterns coming from the frontend on chip, but also to create artificial stimuli from a development environment and to inject them at specific points in the signal processing path to allow testing the processing chain on-chip step by step. This improvement of testing the processing chain on-chip helps increasing the accuracy by following up on intermediate test parameters. Currently BOCI is already used in the industrial (mass production) context but not yet in V&V. The implementation of BOCI in V&V will come with big advantages in terms of comparability of test results between V&V and the industrial application. Within VALU3S, parts of BOCI will be implemented in order to enable this comparability.

  • Proven method in IC/SOC validation 
  • High test speed 
  • Independent from external test equipment 
  • Accurate testing of internal building blocks 
  • Exclusion of certain building blocks from the system testing 
  • Difficult to parallelize 
  • Takes time to set up 
  • Testing requires probing of the IC 
  • Not flexible to fast adaptations 
Method Dimensions
In-the-lab environment
Experimental - Testing
Hardware, Software
System testing
Thinking, Sensing
Functional
V&V process criteria, SCP criteria
Relations
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